Understanding and Meeting Vibration Specifications with Piezoelectric Accelerometers

Presented by Dr. Steve Hambric

Vibration specifications vary widely across industries, often defining strict limits for acceleration, velocity, displacement, and dynamic stiffness. This webinar will demonstrate how piezoelectric accelerometers can accurately evaluate these parameters—especially in precision-critical environments such as semiconductor manufacturing facilities.

You'll also explore the increasing importance of multi-axis vibration measurement and foundation dynamic stiffness evaluation, including practical guidance on selecting the right sensors and implementing effective measurement strategies. We'll break down what it takes to meet today's most demanding standards, including VC-G and NIST-A.

In this webinar, you will:

• Understand how piezoelectric accelerometers are used to assess vibration criteria in high-precision environments.
• Learn practical strategies for evaluating multi-axis vibration and foundation dynamic stiffness.
• Gain actionable guidance on sensor selection and measurement techniques to comply with rigorous standards such as VC-G and NIST-A.



Resources

• White Paper: Understanding and Meeting Vibration Specifications with Piezoelectric Accelerometers
• White Paper: High Sensitivity Accelerometers to Monitor Traffic and Railroad Vibration for Semiconductor Manufacturing Facilities
• White Paper: High Sensitivity Accelerometers for Monitoring Semiconductor Manufacturing
• White Paper: Signal Processing Impacts of ICP® Accelerometer Limit Violations
• Brochure: Sensors for Semiconductor Manufacturing
• Brochure: High Sensitivity Dynamic Sensors for Semiconductor Manufacturing Applications
• Catalog: Sensors for Research and Development